Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...