Abstract: Classifying wafer defects in the wafer manufacturing process is increasingly critical for ensuring high-quality production, optimizing processes, and reducing costs. Most existing methods ...
Abstract: This paper presents a pulse-arrival-time (PAT) estimation scheme using Extreme Gradient Boosting (XGBoost) regression and its implementation with hardware description language (HDL). PAT is ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results