ITF research reveals serious abuses of fishers’ labour rights on vessels operating in Marine Stewardship Council-certified ...
During this week in Maribor, the continental event took a decisive step by integrating adapted divisions into the official ...
Abstract: Defect pattern recognition (DPR) of wafer maps is critical for determining the root cause of production defects, which can provide insights for the yield improvement in wafer foundries.
Abstract: The era of artificial neural network (ANN) began with a simplified application in many fields and remarkable success in pattern recognition (PR) even in manufacturing industries. Although ...