Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

System reliability and safety are paramount across industries such as semiconductors, energy, automotive, and steel, where even microscopic cracks or defects within structures can critically affect ...

KLA (NasdaqGS:KLAC) is reporting strong and sustained market share gains in semiconductor inspection equipment. These gains are linked to its leading edge inspection technology and industry leading ...

As the strip being inspected that day passed through the scanning device, 132 square boxes appeared on the monitor, each filled with green (normal) or red (defective) lights. The time taken to inspect ...

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

The 2026 SPIE Advanced Lithography + Patterning conference highlighted AI, both as a challenge and a solution. A case in point was the opening ...