Researchers used AI-guided electron microscopy to map atomic-level point defects in 3D within ultrathin MXene layers, ...
Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
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AI-based model measures atomic defects in materials
In biology, defects are generally bad. But in materials science, defects can be intentionally tuned to give materials useful new properties. Today, atomic-scale defects are carefully introduced during ...
(Nanowerk Spotlight) Scientists have sought to leverage atomic defects to enhance electrocatalytic performance for clean energy applications. However, the inability to precisely study defects' ...
Emergence of anti-hyperuniform defect organization in active nematics. At high activity (left), topological defects are distributed nearly uniformly throughout the system. Reducing activity toward a ...
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