Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

As companies strive to achieve higher quality and reliability for their products, and as package sizes and the number of available pins continue to shrink, there is also a persistent need to keep test ...

Embedded test compression is a standard technique for dramatically reducing the test data volume and test time on the automatic test equipment. Companies typically aim for 60x to 100x compression for ...